PTM-120B can be applied to contact/contactless and dual interface chip initialization,and also can be customized according to the demands for various chip production.
PARAMETER
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PARAMETER
The position adjustment of the active and driven material trays is convenient and can adapt to different incoming directions; Compatible with 12.6MM and 38MM shaft diameter material trays.
Compatible with 6PIN and 8PN chip production; Supports up to 120 contact test heads and 12 non-contact test heads simultaneously for electrical performance testing and data writing of contact, non-contact, or dual interface modules; Alternatively, 60 contact test heads and 60 non-contact test heads can be configured according to customer requirements. This unit can work independently.
Configure 2 sets of contact test heads or 3 sets of non-contact test heads to automatically write/test failed chips, minimizing waste.
The identification of punch holes for chips that have failed to write or test can be flexibly set through software without the need for manual adjustment, greatly improving the accuracy and production efficiency of punch holes; This unit can work independently.
Roll up the written and tested strips and wrap them with protective tape; This unit can work independently.
Capable of cutting the connecting ribs of chip strips; By changing the mold, it is easy to cut different specifications of chip strips; This unit can work independently.
WHY
1. The equipment is compatible with 6pin and 8pin module strip production.
High-performance reader
Visual inspection
The flexible testing scheme is suitable for different IC module applications.
Independent punching mechanism can accurately set the punching position of double row chip through parameters (XY direction can be used), without adjusting the position of mechanical structure, high precision and good punching consistency.
Free of production site due to electric driving design without external air supply.
Open-short test for pins (positive and negative current is adjustable).
FVMI and FIMV (V=f(I), I=f(V)) supported.
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